发明名称 SEMICONDUCTOR QUANTUM DOT ELEMENT AND ITS MANUFACTURE
摘要 PROBLEM TO BE SOLVED: To realize a highly efficient quantum dot device which reflects narrow state density of quantum dot by forming a semiconductor quantum dot structure with highly uniform size distribution. SOLUTION: InAs dot formed by using strain relaxation on a GaAs layer is buried in a GaAs film 4 to a thickness not more than a thickness of dot thickness. InGaAs is formed to a layer t fill a hole formed by removing the dot by thermal etching. A surface is thereby flat and an InGaAs quantum dot 5 of uniform thickness is formed in a hole part at high density by forming InGaAs to a layer at least to a depth of a hole. A quantum dot laser which oscillates at a low threshold value current, for example, is realized by preparing a quantum dot device by using the quantum dot 5.
申请公布号 JP2000188443(A) 申请公布日期 2000.07.04
申请号 JP19980363281 申请日期 1998.12.21
申请人 NEC CORP 发明人 SAITO HIDEAKI
分类号 H01L29/06;H01L29/201;H01L29/80;H01S5/00;H01S5/343;(IPC1-7):H01S5/343 主分类号 H01L29/06
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