发明名称 |
Exposure control on the basis of a relevant part of an X-ray image |
摘要 |
An X-ray examination apparatus according to the present invention includes an X-ray detector for deriving an image signal from an X-ray image, and an exposure control system for adjustment of the X-ray examination apparatus on the basis of a relevant part of the X-ray image. The exposure control system is arranged to group pixels of the X-ray image in one or more clusters on the basis of their brightness values and to select the relevant part of the X-ray image from the clusters.
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申请公布号 |
US6084940(A) |
申请公布日期 |
2000.07.04 |
申请号 |
US19980061811 |
申请日期 |
1998.04.16 |
申请人 |
U.S. PHILIPS CORPORATION |
发明人 |
VAN ASTEN, ALDEGONDA C. M. |
分类号 |
H05G1/30;H05G1/36;H05G1/38;H05G1/64;(IPC1-7):H05G1/64 |
主分类号 |
H05G1/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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