发明名称 Exposure control on the basis of a relevant part of an X-ray image
摘要 An X-ray examination apparatus according to the present invention includes an X-ray detector for deriving an image signal from an X-ray image, and an exposure control system for adjustment of the X-ray examination apparatus on the basis of a relevant part of the X-ray image. The exposure control system is arranged to group pixels of the X-ray image in one or more clusters on the basis of their brightness values and to select the relevant part of the X-ray image from the clusters.
申请公布号 US6084940(A) 申请公布日期 2000.07.04
申请号 US19980061811 申请日期 1998.04.16
申请人 U.S. PHILIPS CORPORATION 发明人 VAN ASTEN, ALDEGONDA C. M.
分类号 H05G1/30;H05G1/36;H05G1/38;H05G1/64;(IPC1-7):H05G1/64 主分类号 H05G1/30
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