发明名称 PATTERN-FORMING APPARATUS, AND COATING/DEVELOPING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a pattern-forming apparatus and coating/developing apparatus, which can inexpensively dispense with fine temperature adjustment. SOLUTION: A coating/developing apparatus 5 for coating a resist solution on a substrate and for developing the substrate, after being subjected to light exposure is connected to an aligner 6 through an interface 4. Then the aligner 6 is connected with the interface 4 via a duct 42 to communicate therewith, so that a clean air having an adjusted temperature supplied from the outside into the aligner 6 is also supplied, even into the interface 4 from the aligner 6 via the duct 42. Thereby the inside atmosphere of the interface can be adjusted to have the same atmospheric temperature as in the aligner 6, while eliminating the need for fine temperature adjustment within the interface 4.
申请公布号 JP2000188253(A) 申请公布日期 2000.07.04
申请号 JP19990195831 申请日期 1999.07.09
申请人 TOKYO ELECTRON LTD 发明人 YAMAGUCHI TADAYUKI;MATSUSHITA MICHIAKI
分类号 H01L21/027;G03F7/16;G03F7/20;G03F7/30 主分类号 H01L21/027
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