| 摘要 |
An improved echelle spectrometer comprises a slit in light blocking plate, an echelle grating, and a detector array. The slit is shaped and oriented to align an image of a light beam projected through the slit, onto the echelle grating and onto the d etector in a desired orientation and shape relative to the detector array. Precise adjustment of the shape and orientation of the slit is dependent on the orientation of the detecto r with respect to the dispersion direction of the echelle grating. The echelle spectrom eter provides high detector resolution with reduced read-out time.
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