发明名称 |
Method for manufacturing DRAM capacitor |
摘要 |
A method for manufacturing a DRAM capacitor is provided to form a lower electrode with a cylindrical profile by using a first stage and a second stage. The stages provide different etching rates in various situations. The invention uses the stages to allow the part of the second polysilicon layer between the capacitors to be completely etched and prevent the other part of the second polysilicon layer serving as a lower electrode from over-etching. The invention provides an easier process of forming a cylindrical capacitor with a larger surface.
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申请公布号 |
US6080619(A) |
申请公布日期 |
2000.06.27 |
申请号 |
US19980085903 |
申请日期 |
1998.05.27 |
申请人 |
UNITED MICROELECTRONICS CORP. |
发明人 |
CHIEN, SUN-CHIEH;WU, KING-LUNG;WANG, CHUAN-FU;JENQ, JASON |
分类号 |
H01L21/02;H01L21/8242;H01L27/108;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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