发明名称 |
Test method of one chip micro-computer and one chip micro-computer for conducting the test |
摘要 |
When testing internal state of one chip micro-computer having a CPU and a ROM installed in a single package, data D read from the ROM is subjected to non-degenerate conversion using data DT from the outside and is executed as a command code by the CPU in a test mode. To input the data DT which can serve as a correct command code from the outside, it is necessary that the data D is known. A third party is incapable of conducting a test for testing the internal state and wrongfully reading the written data.
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申请公布号 |
US6081908(A) |
申请公布日期 |
2000.06.27 |
申请号 |
US19980015400 |
申请日期 |
1998.01.29 |
申请人 |
KAWASAKI STEEL CORPORATION |
发明人 |
YAMADA, YASUO |
分类号 |
G06F11/263;G06F11/273;G06F12/14;(IPC1-7):C06F11/00 |
主分类号 |
G06F11/263 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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