发明名称 Test method of one chip micro-computer and one chip micro-computer for conducting the test
摘要 When testing internal state of one chip micro-computer having a CPU and a ROM installed in a single package, data D read from the ROM is subjected to non-degenerate conversion using data DT from the outside and is executed as a command code by the CPU in a test mode. To input the data DT which can serve as a correct command code from the outside, it is necessary that the data D is known. A third party is incapable of conducting a test for testing the internal state and wrongfully reading the written data.
申请公布号 US6081908(A) 申请公布日期 2000.06.27
申请号 US19980015400 申请日期 1998.01.29
申请人 KAWASAKI STEEL CORPORATION 发明人 YAMADA, YASUO
分类号 G06F11/263;G06F11/273;G06F12/14;(IPC1-7):C06F11/00 主分类号 G06F11/263
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