发明名称 APPARATUS FOR PROCESSING SEMICONDUCTOR SUBSTRATES AND PROCESSING METHOD
摘要 PURPOSE: A plasma processing apparatus and method thereof are provided to minimize particles in chamber and improve an operation rate by restraining a stripping of coated film or attached material. CONSTITUTION: In a plasma processing apparatus(10), surroundings of an upper electrode(14)and a lower electrode(16) are arranged to an upper and a lower quartz jigs(18,20), respectively. The lower quartz jig(20) further includes a stepped processing part(30) formed at inner edge portions of the lower quartz jig(20). The stepped processing part(30) has a rectangular platform(30a). The upper quartz jig(18) includes also a stepped processing part(30) formed at inner edge portions of the upper quartz jig(18). The stepped processing part(30) also has a rectangular platform(30a). Preferably, the stepped processing part(30) has concave and convex patterns composed of the rectangular platform(30a).
申请公布号 KR20000035768(A) 申请公布日期 2000.06.26
申请号 KR19990053714 申请日期 1999.11.30
申请人 KAWASAKI STEEL CORPORATION 发明人 SZUKI KATHNORI;HORIUCHI HIDETAKA;GIKUCHI YASSHI;YOKOGAWA JIN;KUBO RYOICHI;WAKABAYASHI GOJI
分类号 H01L21/30;C23C16/44;H01J37/32;H01L21/00;(IPC1-7):H01L21/30 主分类号 H01L21/30
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