发明名称 |
APPARATUS FOR PROCESSING SEMICONDUCTOR SUBSTRATES AND PROCESSING METHOD |
摘要 |
PURPOSE: A plasma processing apparatus and method thereof are provided to minimize particles in chamber and improve an operation rate by restraining a stripping of coated film or attached material. CONSTITUTION: In a plasma processing apparatus(10), surroundings of an upper electrode(14)and a lower electrode(16) are arranged to an upper and a lower quartz jigs(18,20), respectively. The lower quartz jig(20) further includes a stepped processing part(30) formed at inner edge portions of the lower quartz jig(20). The stepped processing part(30) has a rectangular platform(30a). The upper quartz jig(18) includes also a stepped processing part(30) formed at inner edge portions of the upper quartz jig(18). The stepped processing part(30) also has a rectangular platform(30a). Preferably, the stepped processing part(30) has concave and convex patterns composed of the rectangular platform(30a).
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申请公布号 |
KR20000035768(A) |
申请公布日期 |
2000.06.26 |
申请号 |
KR19990053714 |
申请日期 |
1999.11.30 |
申请人 |
KAWASAKI STEEL CORPORATION |
发明人 |
SZUKI KATHNORI;HORIUCHI HIDETAKA;GIKUCHI YASSHI;YOKOGAWA JIN;KUBO RYOICHI;WAKABAYASHI GOJI |
分类号 |
H01L21/30;C23C16/44;H01J37/32;H01L21/00;(IPC1-7):H01L21/30 |
主分类号 |
H01L21/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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