| 摘要 |
PURPOSE: A semiconductor integrated circuit is provided to improve exchange efficiency of a defect exchange such as a defect repair. CONSTITUTION: A semiconductor integrated circuit comprises a central processing unit(1), anon volatile memory(11) and a volatile memory(12) which are integrated in a single semiconductor substrate. The non volatile memory(11) is accessed by the central processing unit(10), and is capable of being changed electrically. The volatile memory(12) is accessed by the central processing unit(10), and has a plurality of normal volatile memory cells and a plurality of redundant volatile memory cells. The volatile memory(12) is configured to latch repair information for repairing a defective normal memory cell with a corresponding redundant memory cell. A part of the non volatile memory cells are constituted of memory cells for storing repair information of the non volatile memory cells together with the repair information of the volatile memory cells. The repair information is read out from the non volatile memory cells on the basis of initialization directions to the semiconductor integrated circuit. The repair information read out from the non volatile memory cells is latched in a repair address register(12AR) of the volatile memory(12).
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