发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for fabricating a semiconductor device is provided to suppress an increase of a concave portion in a copper alloy layer induced by a polishing when forming a buried wiring of a copper alloy in a groove. CONSTITUTION: In a method for fabricating a semiconductor device, grooves for a wiring a reformed in an insulation layer(11) which is formed on a wiring substrate(10). A lower metal layer(12) and an upper metal layer(13) are sequentially formed on the insulation layer(11) comprising the grooves. The upper metal layer(13) is polished, and then the lower metal layer(12) is polished in a polishing speed five times more speedy than that of the upper metal layer(13).
申请公布号 KR20000035287(A) 申请公布日期 2000.06.26
申请号 KR19990049144 申请日期 1999.11.08
申请人 HITACHI.LTD. 发明人 HOMMA YOSHIO;GONDO SEIICHI;SAKUMA NORIYIKI;OHASHI NAOHUMI;IMAI TOSHINORI;YAMAGUCHI HIZRU;OWADA NOBUO
分类号 H01L21/3205;C09G1/02;H01L21/304;H01L21/321;H01L21/44;H01L21/4763;H01L21/48;H01L21/50;H01L21/768;H01L21/8242;H01L23/52;H01L27/108;(IPC1-7):H01L21/304 主分类号 H01L21/3205
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