| 摘要 |
PROBLEM TO BE SOLVED: To enable shortening a time required for finishing all tests without moving a test piece during processes of first and second probing tests. SOLUTION: This semiconductor storage has a redundant fuse 10 provided between a power source potential Vcc and a ground potential GND, a detecting circuit 2 connected to a node of one electrode side of this redundant fuse 10, outputting a signal in response to a potential of the connected node, and a selector circuit 3 transferring selectively inputted data to either of a memory cell being normally used or a redundant memory cell, in response to a signal outputted by this detecting circuit 2. Further, the device has a control circuit 6 controlling connection between the power source potential Vcc and the redundant fuse 10 and pads 8, 9 for applying voltage connected respectively to both ends of the redundant fuse 10, and the redundant fuse 10 is constituted of a material which is cut off by making a high current flow.
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