发明名称 METHOD AND DEVICE FOR INSPECTING PATTERN WIRING BOARD
摘要 PROBLEM TO BE SOLVED: To obtain a method and device for inspecting pattern wiring boards to measure the electric resistance value of electric wiring to be inspected while probes for measuring electric resistance values and the terminals of the electric wiring of a pattern wiring board are held in a state within a predetermined range of contact resistance values at all times. SOLUTION: A comparison processing part 6 for comparing the electric resistance value of standard electric wiring measured by a resistance measuring device 5 with the electric resistance value of standard electric wiring stored in a standard resistance value storage part 7 is provided to compare the measured value of the standard electric resistance wiring and the electric resistance value of the standard electric resistance wiring stored in the standard resistance value storage part 7 for every measurement of the electric resistance value of electric wiring to be inspected. By this, the electric resistance value of the electric wiring to be inspected is measured while verifying that a probe A3, a probe B4, and the terminals of the electric wiring of a pattern wiring board 11 are held at a contact resistance value within a predetermined value.
申请公布号 JP2000171513(A) 申请公布日期 2000.06.23
申请号 JP19980349881 申请日期 1998.12.09
申请人 NEC IBARAKI LTD 发明人 FUKAMI YOSHIYUKI
分类号 G01R31/02;G01R27/02;(IPC1-7):G01R31/02 主分类号 G01R31/02
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