| 摘要 |
PROBLEM TO BE SOLVED: To enable normal tests of LSIs and continuity tests of power source terminals and GND terminals by the same test board. SOLUTION: The signal pins T1, T2, T5, and T6 of an LSI tester are capable of connection not only to the signal terminals D1, D3, D7, and D9 of a DUT but also to its power source terminals D2 and D10 and GND terminals D4 and D8 by selecting switches S1, S2, S3, S4, S5, S6, S7, and S8 on a test board. By individually allotting the signal pins T1, T2, T5, and T6 of the LSI tester to the power source terminals D2 and D10 and GND terminals D4 and D8 of the DUT, continuity tests of the power terminals D2 and D10 and GND terminals D4 and D8 of the DUT are performed for every one pin.
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