发明名称 WAVELENGTH CHARACTERISTIC MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a wavelength characteristic measuring device having a shutter causing no deterioration of optical parts or an actuator. SOLUTION: In this wavelength characteristic measuring device 5 including instruments 18, 19 for measuring wavelength characteristics of an excimer laser device, and a monitor box 22 for housing the instruments 18, 19 therein, an actuator 44 for opening/closing a shutter 39 for intercepting laser light 1 entering the instruments 18 is provided in an exterior of the monitor box 22. Accordingly, an impurity gas generated from the actuator is prevented from entering the monitor box 22, so that deterioration of optical parts can be prevented.
申请公布号 JP2000171303(A) 申请公布日期 2000.06.23
申请号 JP19980359995 申请日期 1998.12.04
申请人 KOMATSU LTD 发明人 BUTSUSHIDA SATORU;NAKANE MOTOHARU
分类号 H01S3/225;G01J3/45;G01J9/02;H01S3/00;(IPC1-7):G01J3/45 主分类号 H01S3/225
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