发明名称 SEMICONDUCTOR CONTROLLED RECTIFYING DEVICE
摘要 PROBLEM TO BE SOLVED: To improve di/dt resistance and turn-off characteristic by reducing emitter short-circuiting effect and enhancing the gate sensitivity of an auxiliary thyristor. SOLUTION: This rectifying device is provided with a second NE layer arranged opposite to an auxiliary thyristor 12, a cathode emitter electrode 3 formed thereon, and an anode electrode formed on the main surface of the opposite side of a main surface on which the cathode emitter electrode 3 is formed. The auxiliary thyristor 12 is provided with a plurarity of through holes 13 in an area not covering a boundary section between a first NE layer surface and a PB layer surface. In the embodiment, the first NE layer is formed concentrically in a manner to surround a main gate electrode 1, and the second NE layer is formed concentrically on its outer periphery.
申请公布号 JP2000174257(A) 申请公布日期 2000.06.23
申请号 JP19980348331 申请日期 1998.12.08
申请人 NIPPON INTER ELECTRONICS CORP 发明人 SAKAMOTO HIROAKI;OKAMOTO KYOICHI;OKI TOMOAKI;OGIWARA YUKIO
分类号 H01L29/74;(IPC1-7):H01L29/74 主分类号 H01L29/74
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