发明名称 |
SEMICONDUCTOR CONTROLLED RECTIFYING DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To improve di/dt resistance and turn-off characteristic by reducing emitter short-circuiting effect and enhancing the gate sensitivity of an auxiliary thyristor. SOLUTION: This rectifying device is provided with a second NE layer arranged opposite to an auxiliary thyristor 12, a cathode emitter electrode 3 formed thereon, and an anode electrode formed on the main surface of the opposite side of a main surface on which the cathode emitter electrode 3 is formed. The auxiliary thyristor 12 is provided with a plurarity of through holes 13 in an area not covering a boundary section between a first NE layer surface and a PB layer surface. In the embodiment, the first NE layer is formed concentrically in a manner to surround a main gate electrode 1, and the second NE layer is formed concentrically on its outer periphery.
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申请公布号 |
JP2000174257(A) |
申请公布日期 |
2000.06.23 |
申请号 |
JP19980348331 |
申请日期 |
1998.12.08 |
申请人 |
NIPPON INTER ELECTRONICS CORP |
发明人 |
SAKAMOTO HIROAKI;OKAMOTO KYOICHI;OKI TOMOAKI;OGIWARA YUKIO |
分类号 |
H01L29/74;(IPC1-7):H01L29/74 |
主分类号 |
H01L29/74 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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