| 摘要 |
PROBLEM TO BE SOLVED: To unnecessitate an expensive semiconductor test device and to enable shortening a test time when a semiconductor storage is tested. SOLUTION: When a semiconductor storage 11 having a storage region 54, its peripheral circuit 53, and a control circuit 51 for performing write-in/erasion for the storage region 54 by the peripheral circuit 53 is tested, the peripheral circuit 53 and the storage region 54 are tested using an outside attached or incorporated microcomputer 16 for test.
|
