发明名称 Thin film transistor with reduced parasitic capacitance
摘要 An improved thin film transistor structure is provided having no source/gate or drain/gate overlap. A laser doping technique is applied to fabricate such transistors. Eliminating source/gate and drain/gate overlap significantly reduces or eliminates parasitic capacitance and feed-through voltage between source and gate. Short-channel a-Si:H thin film transistors may be obtained having high field effect mobilities. Improved pixel performance and pixel-to-pixel uniformity is provided. <IMAGE>
申请公布号 EP0902481(A3) 申请公布日期 2000.06.21
申请号 EP19980115454 申请日期 1998.08.17
申请人 XEROX CORPORATION 发明人 MEI, PING;LUJAN, RENE A.;BOYCE, JAMES B.;CHUA, CHRISTOPHER L.;HACK, MICHAEL G.
分类号 H01L21/223;H01L21/225;H01L21/266;H01L21/336;H01L27/144;H01L27/146;H01L29/786;H01L31/0216 主分类号 H01L21/223
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