The invention relates to a gas analysis apparatus comprising a measuring head. Chambers with specifically sensitive semiconductor gas sensors or semiconductor gas sensors of the same kind are located in said measuring head, are covered by a lid and are only released for aeration by means of a hole in said lid. Said design enables reception of gas-specific sensor signal temperature profiles, reduction of the time required for the determination of a corresponding gas component and simultaneous increase in the selectivity of the gas analysis apparatus. The evaluation method can be used for different states of the measuring medium and is an exclusive classification method.
