发明名称 Method of producing semiconductor device
摘要 A silicon oxide film is formed as an under film on a glass substrate and then an amorphous silicon film is formed thereon. Using hydrogen plasma produced by a frequency of 50 to 100 MHz, the amorphous silicon film formed on the glass substrate is processed. In this plasma processing, hydrogen atoms in the amorphous silicon film is combined with hydrogen atoms in the plasma with a high energy state, so that a gas is generated and the dehydrogenation from the amorphous silicon film progresses. After the dehydrogenation is completed, the heating treatment is performed to crystallize the amorphous silicon film and to transform the amorphous silicon film into a crystalline silicon film.
申请公布号 US6077759(A) 申请公布日期 2000.06.20
申请号 US19970928746 申请日期 1997.09.12
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., 发明人 YAMAZAKI, SHUNPEI;TERAMOTO, SATOSHI
分类号 H05H1/46;C23C16/24;C23C16/50;C23C16/56;H01L21/20;H01L21/205;H01L21/336;H01L29/786;(IPC1-7):C23C16/00 主分类号 H05H1/46
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