发明名称 Matrix type multiple numeration system ferroelectric random access memory using leakage current
摘要 The present invention relates to a matrix type multiple numeration system ferroelectric random access memory using a leakage current of dielectric, which is non-volatile and with which a multiple numeration system is realized, and a method for manufacturing the same. In the memory according to the present invention, the unit cells formed of the dielectric and ferroelectric capacitors are arranged in a matrix, the lower electrodes are connected to bit lines, and the upper electrodes are connected to word lines. Thus, a transistor for selecting cells is included for each word line and each bit line. Therefore, it is possible to heighten the integration degree, since the memory cells are each formed of only a dielectric and a ferroelectric capacitor, and to improve productivity since manufacturing processes are simple.
申请公布号 US6077716(A) 申请公布日期 2000.06.20
申请号 US19990368580 申请日期 1999.08.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YOO, IN-KYEONG
分类号 H01L27/108;G11C11/56;H01L21/8246;H01L27/115;(IPC1-7):H01L21/00 主分类号 H01L27/108
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