| 摘要 |
PCT No. PCT/FI97/00371 Sec. 371 Date Dec. 11, 1998 Sec. 102(e) Date Dec. 11, 1998 PCT Filed Jun. 12, 1997 PCT Pub. No. WO97/47960 PCT Pub. Date Dec. 18, 1997The invention relates to a method and an apparatus for metering evaporation. According to the invention the temperatures (Tk, Tm, T) are defined for a comparing piece (6) in an essentially non-evaporating state, for a comparing piece (8) in an essentially evaporating state and for the metered object (1). Based on a mutual comparison of the obtained temperature values (Tk, Tm, T) the evaporation index (n) dependent on the amount of liquid evaporated will be defined.
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