发明名称 Method of fabricating thin film transistors
摘要 A method is provided for fabricating a thin film transistor on a substrate. The method includes the steps of forming an active layer having a channel region on the substrate, forming an impurity-blocking mask covering the channel region and portions of the active layer outside the channel region adjacent the channel region, and doping impurities of a first conductivity type at a high density into portions of the active layer uncovered by the impurity-blocking mask to form impurity-doped regions in the active layer. The method further includes the steps of removing the impurity-blocking mask and thereafter performing a plasma treatment on the resultant structure using a plasma gas containing impurities of the first conductivity type to form LDD regions in the active layer between the channel region and the impurity-doped regions.
申请公布号 US6077730(A) 申请公布日期 2000.06.20
申请号 US19980022415 申请日期 1998.02.12
申请人 LG ELECTRONICS, INC. 发明人 LEE, SANG-GUL;YEO, JU-CHEON;HA, YONG-MIN
分类号 H01L29/786;H01L21/336;H01L21/84;(IPC1-7):H01L21/84 主分类号 H01L29/786
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