发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To prepare a low-resistance and highly transparent conductive film with which the productivity can be improved, by preparing a silicon oxide film and a crystallized silicon film on a silicon nitride film formed on an insulating substrate. SOLUTION: A silicon nitride film 2 is deposited with a plasma CVD technique on whole of a surface of a glass substrate 1. A silicon oxide film is subsequently formed as an underlying oxide film 3. Then, an amorphous silicon film 4 is deposited with a plasma CVD technique or LPCVD technique, and further a protective layer 5, which is either a silicon oxide or a silicon nitride film, is formed with a CVD technique. The silicon film 4 is irradiated with a pulsed laser light to improve the crystallinity. The protective layer 5 is removed to pattern the silicon film into an island-shaped region 6. A gate oxide film 7 is formed by annealing a film deposited by decomposing TEOS or by sputtering in oxygen atmosphere. Aluminum is electron-beam evaporated on the gate oxide film 7 to form a gate electrode 8, through which a current is flowed to form an anodic oxide layer 9 on its surrounding.
申请公布号 JP2000164888(A) 申请公布日期 2000.06.16
申请号 JP20000002753 申请日期 2000.01.11
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 MURAKAMI AKANE;SAI HOSHUN;MIYAZAKI MINORU
分类号 H01L21/318;G02F1/136;G02F1/1368;H01B5/14;H01L21/285;H01L21/336;H01L27/146;H01L29/786;(IPC1-7):H01L29/786 主分类号 H01L21/318
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