发明名称 SCANNING PROBE MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To enable fine and high-speed movement of a probe for enabling capture of roaming atoms or molecules. SOLUTION: This scanning probe microscope is provided with provisions for allowing a probe 1 and a sample 2 to approach each other and scanning the probe 1, while applying feedback so as to make the current flowing across between both of them or the action acting between both of them constant, a means for moving the probe 1 in a shape close to an atomic size at a high speed at which feedback will not follow.
申请公布号 JP2000162218(A) 申请公布日期 2000.06.16
申请号 JP19980340333 申请日期 1998.11.30
申请人 JEOL LTD 发明人 IWATSUKI MASASHI;SATO TOMOSHIGE
分类号 H01J37/30;G01N37/00;G01Q10/04;G01Q10/06;G01Q90/00;(IPC1-7):G01N37/00;G01N13/10 主分类号 H01J37/30
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