发明名称 APPEARANCE INSPECTING METHOD AND APPEARANCE INSPECTING DEVICE
摘要 PROBLEM TO BE SOLVED: To shorten the throughput of an appearance inspection. SOLUTION: This method comprises a first step of lighting an object to be inspected W placed on a first stage 10 and receiving the scattered light, thereby inspecting the object to be inspected W; a second step of lighting the object to be inspected W placed on a second stage 11 and receiving the refracted light, thereby inspecting the object to be inspected W; and a carrying step of carrying the object to be inspected W extending over the first stage 10 and the second stage 11 so as to perform either one of the first step and second step after the other.
申请公布号 JP2000162144(A) 申请公布日期 2000.06.16
申请号 JP19980340801 申请日期 1998.11.30
申请人 NIKON CORP 发明人 MURATA KOJI
分类号 G01B11/30;G01B11/24;G01N21/47;G01N21/88;G01N21/94;G01N21/95;G01N21/956;H01L21/66;(IPC1-7):G01N21/88 主分类号 G01B11/30
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