| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor testing device capable of easily and speedily detecting a glitch which appears in a test signal. SOLUTION: A comparison voltage generator 15 as a glitch-extracting means compares a comparison voltage (a first reference signal), having a voltage level according to an internal signal which specifies a test signal with the test signal for extracting a glitch. A comparison circuit 16 as an disagreement detecting means compares the comparison logic (a second reference signal), having a logic value according to the internal signal with the glitch extracted by the comparison voltage generator 15, to detect disagreement of the logic values. A glitch detection control circuit 14 as a detection signal output means outputs a detection signal for indicating the detection of a glitch, when disagreement is detected by the comparison circuit 16.
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