| 摘要 |
<p>PROBLEM TO BE SOLVED: To control the increase of charge fluctuation quantity of a signal line side when the voltage transition of a scan line is performed without making a signal reading circuit complicated and to obtain an excellent signal-to-noise ratio by appropriately using sequential scan for a scan line and a jump scan in at least every other scan line in accordance with an image pickup mode for a subject to drive a switching element. SOLUTION: A scan line driving circuit 12 of an X-ray detector 2 is provided with not only a sequential scan function but also a jump scan function, scans odd number scan lines SLj (j is 1 to m; m is an integer of >=2) in a 1st field in turn, scans odd number scan lines SLj in a 2nd field in turn and scans all of the scan lines SLj corresponding to one frame in the 1st and 2nd fields. It is possible to improve resolution in the direction of a time base without increasing charge fluctuation quantity at all when scan line voltage transition is performed in the same frame frequency instead of sacrificing vertical resolution by performing jump scan in every other scan line in this way.</p> |
