发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device which eliminates the need to alter circuit constitution even when memory parts differing in memory capacity are mounted together and is adaptable as is. SOLUTION: This semiconductor integrated circuit device is provided with an address generator 12 which generates a self-inspection address according to an external clock, an address reset circuit 13 which resets the self-inspection address generated by the address generator 12 according to a memory capacity discrimination signal, a data generator 4 which generates a self-inspection data on receiving the output signal of the address generator 12, a memory control signal generator 5 which generates a memory control signal on receiving the output signal of the address generator 12, a memory part 1 which stores the self-inspection data, and a comparison circuit 6 which makes a pass/fail decision according to the self-inspection data outputted by the output part 1 and the output signal of the address generator 12 and outputs a pass/fail signal.
申请公布号 JP2000163992(A) 申请公布日期 2000.06.16
申请号 JP19980335726 申请日期 1998.11.26
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 SUMIMOTO YOSHIHIKO;OTSUKA HIDEFUMI;SAKAMOTO SHOJI;KATABE YUTAKA
分类号 G01R31/28;G11C29/00;G11C29/12;(IPC1-7):G11C29/00 主分类号 G01R31/28
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