SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

摘要

PROBLEM TO BE SOLVED: To surely and stably set the test mode of a semiconductor integrated circuit device without depending on the source voltage. SOLUTION: A test mode input circuit 15 comprises an NOMS transistor(TR) 22, a PMOS TR 23, an inverter 24, and a current-limiting circuit 25. A boosted power VCP generated by a boosted power circuit is supplied to the gate of the TR 23, and when one connection part of the TR 23 becomes higher than the boosted power VCP as a result of the input of an Extra-High signal, having a voltage higher than a source voltage setting the test mode, the TR 23 is turned on, so that a test mode activation signal CEH is outputted from the output part of the inverter 24 to a command decoder. Thus, the Extra-High signal can be detected without depending on the source voltage.