| 摘要 |
PROBLEM TO BE SOLVED: To provide a maintenance-free test system, which does not require a user to be aware of changes in the configuration of internal hardware as a result of maintenance of the test system. SOLUTION: A maintenance-free test system is constituted of a test controller 14 with test channels, corresponding to the number of a large number of terminal pins of a semiconductor device provided inside the test system for control the various operation of the test system, a test unit 15 for generating test patterns and expected-value patterns at predetermined timing in a predetermined waveform, a test head 16 with a pin assignment converter to provide the test unit 15 with conversion data which indicate the conversion relationship between the physical test pin number of the test unit 15 and an auxiliary tester pin numbers, a driver for providing a device to be tested 18 with a predetermined amplitude value, and a comparator for comparing an output signal from the device to be tested 18 with an expectation value, a switching circuit 24 for switching from a defective tester pin to an auxiliary tester pin on the basis of the conversion data from the pin assign converter, and a system monitor 26 to monitor the switching and to control the data of the switching.
|
