发明名称 |
STRUCTURE FOR FORMING OVERLAY KEY OF MASK FOR EXPOSING SEMICONDUCTOR |
摘要 |
PURPOSE: A structure for forming an overlay key for exposing a semiconductor is provided to conform a pattern of main cell area with a spatial frequency of the overlay key. CONSTITUTION: A chrome layer pattern(12) is formed on the substrate(11) so that a main cell area(13) is formed. Overlay keys(14) are formed at outsides of the main cell area(13). Here, a pitch(P) of chrome layer pattern(12) is accorded with a pitch(P') of the overlay keys(14). An aberration at a lens in an exposing equipment is due to the spatial frequency. Thereby, the misalignment due to the aberration can be prevented.
|
申请公布号 |
KR20000033581(A) |
申请公布日期 |
2000.06.15 |
申请号 |
KR19980050495 |
申请日期 |
1998.11.24 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
NAM, BYOUNG HO |
分类号 |
H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|