发明名称 STRUCTURE FOR FORMING OVERLAY KEY OF MASK FOR EXPOSING SEMICONDUCTOR
摘要 PURPOSE: A structure for forming an overlay key for exposing a semiconductor is provided to conform a pattern of main cell area with a spatial frequency of the overlay key. CONSTITUTION: A chrome layer pattern(12) is formed on the substrate(11) so that a main cell area(13) is formed. Overlay keys(14) are formed at outsides of the main cell area(13). Here, a pitch(P) of chrome layer pattern(12) is accorded with a pitch(P') of the overlay keys(14). An aberration at a lens in an exposing equipment is due to the spatial frequency. Thereby, the misalignment due to the aberration can be prevented.
申请公布号 KR20000033581(A) 申请公布日期 2000.06.15
申请号 KR19980050495 申请日期 1998.11.24
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 NAM, BYOUNG HO
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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