发明名称 DEVICE FOR TESTING CHARACTERISTIC OF AMD SAW FILTER
摘要 PURPOSE: An apparatus for testing characteristic of an SMD saw filter is provided which additionally includes a characteristic tester satisfying the circuit condition of an appliance employing the SMD saw filter to smoothly measure the characteristic of the SMD saw filter. CONSTITUTION: An apparatus for testing characteristic of an SMD saw filter(70) includes a measuring instrument(10) for inputting/outputting a signal for measuring the characteristic of the SMD saw filter, the first transformer(20) for transforming the signal applied from the measuring instrument to be suitable to the voltage signal of an appliance employing the SAM saw filter, and the first time constant controller(30) connected to the first transformer to control the time constant of the signal applied from the first transformer. The apparatus further has an SMD saw filter mount(40) on which the saw filter is mounted, the second time constant controller(50) connected to the SMD saw filter mount to control the time constant of the signal output through the SMD saw filter, and the second transformer(60) connected to the second time constant controller to transform the signal applied from the second time constant controller to be suitable for the measuring instrument to apply the transformed signal to the measuring instrument.
申请公布号 KR100258996(B1) 申请公布日期 2000.06.15
申请号 KR19970072405 申请日期 1997.12.23
申请人 DAEWOO ELECTRONIC COMPONENTS CO., LTD 发明人 BAK BYEONG-HUN
分类号 G01R31/00;(IPC1-7):G01R31/00 主分类号 G01R31/00
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