发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method is provided to fabricate a large integrated semiconductor device which can form an LDD(Lightly Doped Drain) without forming a side wall. CONSTITUTION: A method enables fabricate a MOS transistor of LDD structure without using a side wall to improve the operation characteristics of the semiconductor device. After a gate oxide (14)and a gate electrode material are deposited on top of a semiconductor substrate(11) in sequence, a gate electrode(15) is formed by patterning the gate electrode material. And, a source and an LDD drain are formed simultaneously by implanting an impurity ion of high density, after forming a photoresist pattern on top of the above gate electrode and a region where a lightly doped drain are to be formed.
申请公布号 KR20000033914(A) 申请公布日期 2000.06.15
申请号 KR19980050980 申请日期 1998.11.26
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 BAEK, SEUNG YUK
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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