发明名称 |
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method is provided to fabricate a large integrated semiconductor device which can form an LDD(Lightly Doped Drain) without forming a side wall. CONSTITUTION: A method enables fabricate a MOS transistor of LDD structure without using a side wall to improve the operation characteristics of the semiconductor device. After a gate oxide (14)and a gate electrode material are deposited on top of a semiconductor substrate(11) in sequence, a gate electrode(15) is formed by patterning the gate electrode material. And, a source and an LDD drain are formed simultaneously by implanting an impurity ion of high density, after forming a photoresist pattern on top of the above gate electrode and a region where a lightly doped drain are to be formed.
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申请公布号 |
KR20000033914(A) |
申请公布日期 |
2000.06.15 |
申请号 |
KR19980050980 |
申请日期 |
1998.11.26 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
BAEK, SEUNG YUK |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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