发明名称 SEMICONDUCTOR NEURAL ELECTRODE AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A semiconductor neural electrode and a manufacturing method thereof are provided to freely regulate thickness of a probe of the semiconductor neural electrode, to acquire a manufacturing process of low temperature, to acquire a wide range of doping concentration, and to minimize corrosion due to human liquid. CONSTITUTION: A lower dielectric layer of oxide layer/nitride layer/oxide layer is formed on the front side of a silicon wafer. A Cr/Au layer is evaporated and patterned so that electrodes, combining pads, and connection tracks are formed. An upper dielectric layer of oxide layer/nitride layer/oxide layer is formed. An aluminum layer is evaporated by a sputtering process, and predetermined areas are etched by a photograph process. An oxide layer for a mask layer is evaporated. A 2nd aluminum layer is evaporated by the sputtering process, and the predetermined areas are etched by the photograph process. And trenches are formed by a plasma etching process. The thickness of a probe of the semiconductor neural electrodes can be freely and precisely regulated by using wet and dry etching processes.
申请公布号 KR20000033814(A) 申请公布日期 2000.06.15
申请号 KR19980050836 申请日期 1998.11.20
申请人 KIM, SUNG JUNE 发明人 KIM, SUNG JUNE;HWANG, EUN JEONG;YOON, TAE HWAN
分类号 H01L27/06;(IPC1-7):H01L27/06 主分类号 H01L27/06
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