发明名称 METHOD FOR FORMING ISOLATION REGION OF SEMICONDUCTOR
摘要 PURPOSE: A method for forming an isolation region of a semiconductor is provided to improve isolation characteristics and to suppress junction leakage current by preventing impurity ions from moving off around a border among boards. CONSTITUTION: A method for forming an isolation region of a semiconductor includes first thru fifth steps. In the first step, a semiconductor board(21) is divided into an active region and a field region. In the second step, a trench(25) with predetermined depth is formed in the field region. In the third step, a nitrogen membrane(23) is formed on the surface of the semiconductor board(21). In the forth step, an isolation membrane(28a) is formed in the trench(25). In the fifth step, a well region(29) is formed on the surface of the semiconductor board(21).
申请公布号 KR20000033354(A) 申请公布日期 2000.06.15
申请号 KR19980050194 申请日期 1998.11.23
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 PARK, DAE YOUNG
分类号 H01L21/00;H01L21/60;(IPC1-7):H01L21/00 主分类号 H01L21/00
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