发明名称 OFFSET CONTROL CIRCUIT FOR MEASURING EQUIPMENT
摘要 PURPOSE: An offset control circuit for the measuring equipment is provided to make differential input circuit by using the inversion circuit and non-inversion circuit and to make offset establish to control as user wants it, thereby overcoming the restriction of equipment test and providing an offset control circuit of measuring equipment more accurate inspection than the past time. CONSTITUTION: An offset control circuit of the measuring equipment consists the parts of: an alternating independent current source and direct voltage making standard level, according to level fluctuation of the above-mentioned alternating independent current; the first test signal generation part(50) generating a reversed test signal on setting on or off of switch demagnetization according to the level of the above-mentioned alternating independent current; the second test signal generation part(70) generating test signal of phase by inversing output signal of above-mentioned the first signal generation part; the first offset adder(60) summing alternating signal outputted from the specific test control offset direct voltage and alternating current outputted from the above-mentioned the first test signal generation part(50); the second offset adder adding and outputting alternating signal generated from above-mentioned the second test signal generation part(70) and the above test control offset direct voltage.
申请公布号 KR20000033312(A) 申请公布日期 2000.06.15
申请号 KR19980050146 申请日期 1998.11.23
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, YONG CHANG;KIM, GI YEAL;KIM, YOUNG BU
分类号 G01R31/00;(IPC1-7):G01R31/00 主分类号 G01R31/00
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