发明名称 METHOD FOR PLASMA ETCHING COMPARTMENT SURFACE OF UPPER SIDE OF FARADAY CAGE
摘要 PURPOSE: A method for plasma etching a compartment surface of an upper side of a faraday cage is provided to attain an etched plane with various shapes by changing the direction of etching, and to etch a board uniformly by distracting or concentrating the ion flux. CONSTITUTION: A method for plasma etching a compartment surface of an upper side of a faraday cage(14) includes first thru third steps. At the first step, a faraday cage(14) is deposited in an apparatus for plasma etching. At the second step, a board deposited in the faraday cage(14) is etched. At the third step of the present invention, at least a part of the upper side of the faraday cage is etched using various precursor porous compartments(16). The part etched, the direction of etching, and the velocity of etching are controlled using the various precursor porous compartments(16).
申请公布号 KR20000033006(A) 申请公布日期 2000.06.15
申请号 KR19980049658 申请日期 1998.11.19
申请人 HEOMIZ CO., LTD. 发明人 MOON, SANG HEUP;JO, BYOUNG OK
分类号 H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/3065
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