发明名称 METHOD AND APPARATUS FOR ANALYZING MEASUREMENTS
摘要 A method, apparatus, and article of manufacture for analyzing measurements. The invention provides a method for separating and analyzing the components of a distribution, such as deterministic and random components. The method performs the steps of collecting data from a measurement apparatus, constructing a histogram based on the data such that the histogram defines a distribution, fitting tails regions wherein deterministic and random components and associated statistical confidence levels are estimated.
申请公布号 WO0034901(A2) 申请公布日期 2000.06.15
申请号 WO1999US29007 申请日期 1999.12.08
申请人 WAVECREST CORPORATION 发明人 LI, PENG;JESSEN, ROSS, ADAM;WILSTRUP, JAN, BRIAN;PETRICH, DENNIS
分类号 G01D3/028;G01D21/00;G06F15/00;G06F17/18;G06F17/40;(IPC1-7):G06F17/40 主分类号 G01D3/028
代理机构 代理人
主权项
地址
您可能感兴趣的专利