发明名称 METHOD FOR OBTAINING LIFETIME CHARACTERISTIC DATA OF CATHODE RAY TUBE
摘要 PURPOSE: A method is provided which obtains a lifetime characteristic data, by being more adjacent to a condition of using a cathode ray tube actually. CONSTITUTION: A method is provided to obtain a lifetime characteristic data of a cathode ray tube including a first grid whose electron gun works as a cathode control electrode, a second grid working as a screen electrode, a third grid working as focus electrode, and a fourth grid working as a final focusing electrode. The method includes a step of measuring a cathode applied voltage and a step of measuring the current. In the step of measuring the cathode applied voltage, the cathode applied voltage making a rated current flow in the cathode is measured, in a state that a voltage is applied to each grid. In the step of measuring the current, the current flowing in the cathode is measured according to the time, by applying the voltage of each grid and the measured cathode applied voltage.
申请公布号 KR20000033396(A) 申请公布日期 2000.06.15
申请号 KR19980050240 申请日期 1998.11.23
申请人 SAMSUNG SDI CO., LTD. 发明人 LEE, SANG HO
分类号 H01J9/42;(IPC1-7):H01J9/42 主分类号 H01J9/42
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