发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A dual gate formation method having same profile is provided to simplify the manufacturing process and to overcome the difficulty of ion implantation by using a doped polysilicon without using additional implantation. CONSTITUTION: After forming a first insulating layer on a semiconductor substrate(31), a first polysilicon layer doped with ions of a first conductive type is formed on the first insulating layer. By etching the first polysilicon layer and the first insulating layer using a first photoresist pattern, a first gate(39) is formed. A second insulating layer is formed on the resultant structure. A second polysilicon layer doped with ions of a second conductive type is then formed on the second insulating layer. By etching the second polysilicon layer and the second insulating layer, a second gate(47) is then formed.
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申请公布号 |
KR100258881(B1) |
申请公布日期 |
2000.06.15 |
申请号 |
KR19980006378 |
申请日期 |
1998.02.27 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
PARK, JUNG-SOO |
分类号 |
H01L21/336;H01L21/8234;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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