发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A dual gate formation method having same profile is provided to simplify the manufacturing process and to overcome the difficulty of ion implantation by using a doped polysilicon without using additional implantation. CONSTITUTION: After forming a first insulating layer on a semiconductor substrate(31), a first polysilicon layer doped with ions of a first conductive type is formed on the first insulating layer. By etching the first polysilicon layer and the first insulating layer using a first photoresist pattern, a first gate(39) is formed. A second insulating layer is formed on the resultant structure. A second polysilicon layer doped with ions of a second conductive type is then formed on the second insulating layer. By etching the second polysilicon layer and the second insulating layer, a second gate(47) is then formed.
申请公布号 KR100258881(B1) 申请公布日期 2000.06.15
申请号 KR19980006378 申请日期 1998.02.27
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 PARK, JUNG-SOO
分类号 H01L21/336;H01L21/8234;(IPC1-7):H01L21/336 主分类号 H01L21/336
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