发明名称 METHOD AND APPARATUS FOR ANALYZING MEASUREMENTS
摘要 A method, apparatus, and article of manufacture for analyzing measurements. The invention provides a method for separating and analyzing the components of a distribution, such as deterministic and random components. The method performs the steps of collecting data from a measurement apparatus, constructing a histogram based on the data such that the histogram defines a distribution, fitting tails regions wherein deterministic and random components and associated statistical confidence levels are estimated.</SDOA B>
申请公布号 CA2353817(A1) 申请公布日期 2000.06.15
申请号 CA19992353817 申请日期 1999.12.08
申请人 WAVECREST CORPORATION 发明人 LI, PENG;JESSEN, ROSS ADAM;WILSTRUP, JAN BRIAN;PETRICH, DENNIS
分类号 G01D3/028;G01D21/00;G06F15/00;G06F17/18;G06F17/40;(IPC1-7):G06F17/40 主分类号 G01D3/028
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