| 摘要 |
<p>PROBLEM TO BE SOLVED: To achieve a reduction in the time (tact time) of a process for inspecting substrate glass and to perform reliable inspection. SOLUTION: This transfer device 10 is provided with a support guide that can project inside of a pair of side rails 16 located over a broader area than PDP glass, and a quadric mechanism enabling the PDP glass 12 to be lifted by projection of the support pin and using a side rail 16 as a connecting rod is formed. The oscillating arm 18 of the quadric mechanism is provided with a drive means and the oscillating arms 18, 20 are oscillated by the operation of the drive means, so that the PDP glass 12 held on the side rail 16 can be transferred to an inspection device 14. Therefore, quick transfer is made possible and the time required for an inspection process can be reduced. Also, a stage 32 is flattened and deflection of the PDP glass 12 due to a contactor 36 can be prevented to permit reliable inspection.</p> |
