发明名称 Mass spectrometer
摘要 PCT No. PCT/JP95/01322 Sec. 371 Date Jan. 5, 1998 Sec. 102(e) Date Jan. 5, 1998 PCT Filed Jul. 3, 1995 PCT Pub. No. WO97/02591 PCT Pub. Date Jan. 23, 1997A method of performing a high sensitivity mass analysis is described wherein a plurality of linear quadrupole radio frequency electrodes are aligned, and operated as a mass filter or an ion trap mass analyzer. A background ion removal filter having a linear quadrupole electrode structure may also be connected in cascade to this mass analyzer if necessary. The background ion removal filter powerfully removes background ions so as to improve analytical sensitivity. This mass spectrometer also makes it possible to prevent losses of minute amounts of sample ions in the ion trap, prevent destruction of minute amounts of ions and reduce contamination of the ion trap electrodes.
申请公布号 US6075244(A) 申请公布日期 2000.06.13
申请号 US19980983212 申请日期 1998.01.05
申请人 HITACHI, LTD. 发明人 BABA, TAKASHI;WAKI, IZUMI
分类号 H01J49/42;(IPC1-7):B01D59/44;H01J49/00 主分类号 H01J49/42
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