发明名称 |
Architectural coverage measure |
摘要 |
A tractable architecture level coverage measure uses information about the coverage measures obtained by the data path blocks, control logic blocks and cache to obtain an overall measure of coverage. This technique is applicable to a variety of different designs using different fabrication processes. Moreover, it allows the use of extended length test vectors, for example, such as those using commercial software applications. Since the coverage measure does not rely on the traditional stuck at model, it is applicable to extended length test vectors that may be used with high performance systems.
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申请公布号 |
US6076173(A) |
申请公布日期 |
2000.06.13 |
申请号 |
US19970001607 |
申请日期 |
1997.12.31 |
申请人 |
INTEL CORPORATION |
发明人 |
KIM, KEE SUP;JAYABHARATHI, RATHISH;ARTANG, SAVIZ |
分类号 |
G01R31/3183;(IPC1-7):G06F11/00 |
主分类号 |
G01R31/3183 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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