发明名称 |
Method of fabricating a quantum device |
摘要 |
A method of fabricating quantum wire structures and devices, and quantum dot structures and devices comprise steps of: depositing an insulating layer on a semiconductor substrate, forming a line patterns and a square patterns in an insulating layer, forming a V-grooved patterned structures and a reverse quadrilateral pyramid patterned structures by thermal etching to evaporate portions of the quantum well layer that are not protected by line-shaped mask regions and square-shaped mask regions of the masking layer, forming a quantum wires and a quantum dots by alternatively growing a barrier layer and an active layer on a V-grooved patterned substrate and a reverse quadrilateral pyramid patterned substrate.
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申请公布号 |
US6074936(A) |
申请公布日期 |
2000.06.13 |
申请号 |
US19980093195 |
申请日期 |
1998.06.08 |
申请人 |
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE |
发明人 |
RO, JEONG RAE;KIM, SUNG BOCK;LEE, EL HANG |
分类号 |
H01L21/30;H01L21/20;H01L21/205;H01L21/311;(IPC1-7):H01L21/36;H01L21/00 |
主分类号 |
H01L21/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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