| 摘要 |
PROBLEM TO BE SOLVED: To reduce time required for test pattern generation processing. SOLUTION: A failure detection difficulty circuit judging means 7 for delaying failure information in a partial circuit and outputting it as a list when the number of failures within the partial circuit is larger than a specific value based on the partial circuit and failure information created by a partial circuit creation means 5 is provided. Further, a test pattern is created based on failure information other than that in the partial circuit that is outputted as a delay list from the failure detection difficulty circuit judging means 7 in an ATG means 10, then a test pattern is created based on the failure information in the partial circuit being outputted as the delay list, and failure detection processing is completed when the failure detection reaches a predetermined target failure detection rate. |
