发明名称 |
FLAW DETECTOR |
摘要 |
A flaw detector uses a plurality of imaging means, e.g., first and second imaging means, to find the positions of flaws of objects arranged in predetermined intervals in a direction. The first and second imaging means includes first and second decision means (55, 58) and first and second table means (56, 59) for storing the states of the inspected objects and their associated ID information. Final decision means (60) associates the results of measurement by the first and second imaging means with the ID information indicative of the positions of the inspected objects to make final decision.
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申请公布号 |
WO0033023(A1) |
申请公布日期 |
2000.06.08 |
申请号 |
WO1999JP06699 |
申请日期 |
1999.11.30 |
申请人 |
OLYMPUS OPTICAL CO., LTD.;WATANABE, NOBUYUKI;MINAMI, TAKESHI |
发明人 |
WATANABE, NOBUYUKI;MINAMI, TAKESHI |
分类号 |
G01N21/956;G06T7/00;(IPC1-7):G01B11/00;H05K3/34 |
主分类号 |
G01N21/956 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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