发明名称 ELECTRONIC DEVICE SURFACE SIGNAL CONTROL PROBE AND METHOD OF MANUFACTURING THE PROBE
摘要 <p>A surface signal control probe high in resolution, rigidity, and bending elasticity which can be used for a scanning probe microscope and a highly accurate surface signal control probe for inputting and outputting signals which can be used for a high density magnetic information processing device, comprising a nanotube (24) small in tip curvature radius and high in rigidity and bending elasticity, a holder (2a) holding the nanotube (24), and a fixing means fixing the base part (24b) of the nanotube to the surface of the holder with the tip part (24a) of the nanotube (24) projecting from the holder, wherein the tip part (24a) of the nanotube is used as a probe and the fixing means is formed of a coating film (29) covering the base part (24b) of the nanotube (24) and a fused part where the base part (24b) is fused to the surface of the holder.</p>
申请公布号 WO2000033052(P1) 申请公布日期 2000.06.08
申请号 JP1999006359 申请日期 1999.11.12
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