| 摘要 |
<p>A system and method for inspecting an object, where both a fan beam (20) and a pencil beam (18) of penetrating radiation are used to illuminating the object concurrently. Both beams may be derived from a single source (12) of penetrating radiation. The pencil beam is noncoplanar with the fan beam and may be scanned with resepect to the object. Radiation scattered from the pencil beam within the object is detected (26), and the scatter signal thus generated is used in conjunction with a transmission signal (38) which characterizes attenuation of the fan beam by the object.</p> |
