发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 PROBLEM TO BE SOLVED: To realize a semiconductor device which can be stabilized in element characteristics surely fixing a substrate at a certain potential. SOLUTION: A P-type well layer 2 is formed on a P-type silicon substrate 1, and a gate finger-type N-channel transistor 3 is formed on the P-type well layer 2. A substrate potential fixing P+ layer 10 is formed inside the silicon substrate extending from an active region to the end of a field oxide film 9. A contact hole 12 is bored in the source region 7 of a transistor 3 so as to reach the inside of the substrate potential fixing P+ layer 10 penetrating through the source region 7, so that both the source region 7 and the P+ layer 10 are fixed at a certain potential by the contact hole 12.
申请公布号 JP2000156494(A) 申请公布日期 2000.06.06
申请号 JP19980330029 申请日期 1998.11.19
申请人 NEC CORP 发明人 KINOSHITA YASUSHI
分类号 H01L23/522;H01L21/28;H01L21/768;H01L27/08;H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L23/522
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