发明名称 DEVICE AND METHOD FOR FORMING ALUMINUM OXIDE FILM OF WAFER
摘要 PURPOSE: A device and a method for forming an aluminum oxide film of a wafer are provided to operate a pretreatment and a post-treatment at the same time for improving reliability on a product and for mass-producing by automating the forming process of the aluminum oxide film. CONSTITUTION: A wafer(1) stored in a cassette box(210) is transferred to an aligned(220) by a robot installed in a transferring chamber(200) for the aligned to transfer the wafer to a vacuum cassette module(140). And the wafer is transferred to a hydrogen annealing module(100) for eliminating an oxide film formed on the wafer. Then, the robot transfers the wafer to a plasma cleaning module(110) for eliminating the remained oxide film, and the robot transfers the wafer to a forming module(120) of aluminum oxide film forming an aluminum oxide film on the wafer in an epitaxial method of atom layer. And then, the wafer is transferred to a thermal treating module(130) for the aluminum oxide film to have increased density and stable crystalline structure. And then, the wafer is transferred to a cooling chamber(150) for cooling to complete the forming process of the aluminum oxide film. Therefore, the completed wafer is stored in the other cassette box(230).
申请公布号 KR20000031490(A) 申请公布日期 2000.06.05
申请号 KR19980047547 申请日期 1998.11.06
申请人 INTEGRATED PROCESS SYSTEMS 发明人 CHOI, WON SEONG
分类号 H01L21/3105;(IPC1-7):H01L21/310 主分类号 H01L21/3105
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